The Tutorial fees are as follows and must be paid in USD
|Through January 20, 2016||After January 20, 2016|
|Registration Type||Advanced||Regular & On-site|
|Students/IEEE Life Members||$150.00||$150.00|
Tutorial Fees include access to all tutorials, coffee breaks, breakfast, and lunch.
Presented by: Dr. Robert Lutwak, DARPA
Abstract: The fundamental precision of atomic timekeeping is unequaled in any other measurement methodology. Atomic frequency standards provide the ultimate source of accuracy and stability for all modern communications, navigation, and time-keeping systems. State-of-the-art atomic clocks test the frontiers of theoretical and experimental information theory, atomic physics, and cosmology. Practical implementations of atomic clocks range from commodity rubidium oscillators, smaller than a sandwich and accurate to parts in 10^11, to one-of-a-kind laboratory-scale optical clocks, manned by teams of scientists and achieving accuracies now measured in parts in 10^18.
This tutorial will provide an introduction to atomic frequency standard technology, with particular emphasis on the general scaling rules, atomic physics and engineering challenges common to all implementations in the field.
The tutorial will focus on mature technologies: rubidium oscillators, cesium beam frequency standards, and hydrogen masers. Time permitting, we will also introduce emerging technologies, the application of laser sources to atomic interrogation, coherent population trapping, and chip-scale atomic clocks.
Monday, February 22 10:30 AM
Title: MEMS Inertial Microsensors
Presented by: Dr. Khalil Najafi, University of Michigan
Abstract: MEMS inertial sensors have seen significant development, growth, and commercial interest over the past few decades. The first silicon accelerometer was reported in 1975, and the first micromachined gyroscopes based on silicon technologies was reported in the early 1990s. Since then a number of device structures, fabrication/integration technologies, and circuit architectures have been developed for both accelerometers and gyroscopes. The performance of these MEMS inertial sensors has improved at an amazing pace. However, we are closing in on some basic limits to further improvement. Will MEMS inertial sensors continue their amazing run in both performance and cost? If so, what are the main challenges?
This tutorial will provide an historical perspective of MEMS inertial sensors (fabricated primarily from silicon), will discuss some of the more common transduction mechanisms, device structures, and fabrication technologies used in implementing these sensors, and will discuss some of the key limits to performance (noise/resolution, and stability), as well as approaches that can help overcome these limits. The tutorial will also discuss some of the system challenges (circuits, packaging, and integration), will explore exciting opportunities enabled by improving circuit and integration technologies, and will provide a review of future trends in performance and the application areas that will drive further development of these amazing integrated microsystems.
Monday, February 22 2:00 PM
Title: Basics of Atom Interferometer Sensors
Presented by: Dr. Frank Narducci, Naval Air Systems Command
Abstract: The years 1991-1992 saw the introduction of atom interferometers from four groups. Since then, there has been a tremendous interest in these devices, ranging from their importance in precision measurements to their impact in the state-of-the-art for inertial sensors. In this talk, I will introduce the building blocks of atom optics: the atom beam splitter and the atom mirror. Put together, these elements form a basic atom interferometer. I will address the fundamental sensitivity of these devices as well as what currently drives their limitations. I will discuss state of the art atom interferometers, including gravimeters, gravity gradiometers, gyroscopes, accelerometers and magnetometers. Finally, I will speculate on the future applications of atom interferometer sensors.
Monday, February 22 3:30 PM
Title: Optical Measurement Techniques for Characterization of MEMS Devices
Presented by: Dr. Eric Lawrence, Polytec Inc.
Abstract: Advanced optical measurement techniques are necessary for the characterization of MEMS devices during the development process. Electrical tests provide functionality tests, but do not provide complete measurements of physical properties. This tutorial details the state-of-the-art optical measurement capabilities available for full field dynamic response and surface topography measurements of MEMS devices. This includes use of laser Doppler vibrometry that enables real-time dynamic response measurements with resolution down to the picometer level and frequency bandwidth to 24 MHz. A range of characterization studies are presented that exemplify use of this technology for micro mirror array, pressure sensor, cantilever beam and accelerometer applications.